Optical texture characterization.
Item
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Title
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Optical texture characterization.
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Identifier
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AAI9521304
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identifier
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9521304
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Creator
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Phuvan, Sonlinh.
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Contributor
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Adviser: Yao Li
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Date
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1995
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Language
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English
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Publisher
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City University of New York.
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Subject
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Engineering, Electronics and Electrical | Mathematics | Physics, Optics
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Abstract
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A novel method, the polyfractal measure, for uniquely characterizing fractal texture is described. This technique presupposes that textures are produced by a linear combination of subtextures. Those subtextures are also fractals. There is an infinite set of subtexture combinations which can be used to describe the texture, but a set of subtextures is selected to provide for discriminating between textures. The set of the fractal measure of the discriminating subtextures is obtained, and this set can uniquely identify a texture. The discriminating subtextures are obtained by using a novel pattern classification technique, N-wavelet coding. A set of discriminating features which can be used to classify the textures are obtained using an artificial neural network. Those set of features are used to obtain a set of wavelet function which are used in the detection of those discriminating features (subtextures). The wavelet functions can then be used to create the subtextures, from which the polyfractal measure can be obtained.;An optical technique is developed for implementing the characterization algorithms in real time, using optically addressed amorphous silicon ferroelectric liquid crystal spatial light modulators. All key subsystems, an optical binary to grey level processing and a real time optical iterative processor, are demonstrated.
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Type
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dissertation
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Source
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PQT Legacy CUNY.xlsx
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degree
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Ph.D.
