Resonant x-ray reflectivity studies of nanometric scale structures.

Title: Resonant x-ray reflectivity studies of nanometric scale structures.
Identifier: AAI9707066
identifier: 9707066
Creator: Bai, Jianming.
Contributor: Adviser: Pedro A. Montano
Date: 1996
Language: English
Publisher: City University of New York.
Subject: Physics, Condensed Matter | Engineering, Materials Science
Abstract: We have developed a new method, the resonant x-ray reflectivity (RXR) as a non-destructive structural probe for the study of nanometric scale structures.;For a Ni/Fe alloy thin film, the RXR method is used for determining the composition profile which is impossible with the regular x-ray reflectivity technique. The RXR method is also used to study the interface structures of two Cr/Fe superlattices deposited on MgO substrates with different crystal orientations. We were able to obtain unique and accurate quantitative results of the embedded interfacial roughness for these superlattices.;Also included in this dissertation is an extensive discussion of the theories and experimentation of x-ray reflectivity with synchrotron radiation. Different interface models and calculation methods are compared and, particularly, two calculation formalisms, the form factor method and the line-segment approach are used in the development of the resonant reflectivity technique.
Type: dissertation
Source: PQT Legacy CUNY.xlsx
degree: Ph.D.