The forensic characterization of polyethylene films by elemental analysis using total-reflection X-ray fluorescence (TXRF) spectrometry.

Media

Part of The forensic characterization of polyethylene films by elemental analysis using total-reflection X-ray fluorescence (TXRF) spectrometry.

Title
The forensic characterization of polyethylene films by elemental analysis using total-reflection X-ray fluorescence (TXRF) spectrometry.
Identifier
AAI9924798:pdf